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LOW-TEMPERATURE SYNTHESIZEDZnONANONEEDLES: XPS AND PL ANALYSIS

Author

Listed:
  • DONGSEOK PARK

    (Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea)

  • YOUNGJO TAK

    (Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea)

  • JAEHYUN KIM

    (Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea)

  • KIJUNG YONG

    (Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea)

Abstract

Evolution of morphology change was investigated forZnOnanoneedle array grown by low-temperature MOCVD. Well-alignedZnOnanoneedle array was deposited on theZnObuffer-film/Sisubstrate at temperatures below 500°C. A rod-shapedZnOnanowire in the initial growth stage changed into needle-shaped as the deposition proceeds.ZnOnanoneedle array deposited on the annealed buffer-film showed better alignment compared to that deposited on the as-grown film. XPS analysis showed thatZn2p peak has a single binding energy state of a stoichiometricZn–Obond whileO1 s peak has three different chemical binding states. Highly crystallineZnOnanoneedle array showed a strong bandedge emission at 380 nm in photoluminescence measurements.

Suggested Citation

  • Dongseok Park & Youngjo Tak & Jaehyun Kim & Kijung Yong, 2007. "LOW-TEMPERATURE SYNTHESIZEDZnONANONEEDLES: XPS AND PL ANALYSIS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 14(06), pages 1061-1065.
    • Handle: RePEc:wsi:srlxxx:v:14:y:2007:i:06:n:s0218625x07010639
    DOI: 10.1142/S0218625X07010639
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