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EFFECTS OFLaDOPING ON FERROELECTRIC PROPERTIES OFCaBi4Ti4O15THIN FILMS

Author

Listed:
  • YANXIA DING

    (School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)

  • GUANGDA HU

    (School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)

  • SUHUA FAN

    (College of Materials Science and Engineering, Shandong Jianzhu University, Jinan 250101, China)

Abstract

LamodifiedCBTi(CLBTi) thin films were prepared onPt/Ti/SiO2/Si(100)substrates by a sol–gel technique. X-ray diffraction analysis showed that single phase ofCLBTithin films were obtained. Their crystallization and hysteresis behavior were strongly dependent on the La contents. An increase of2Pras well as a decrease of2Ecwith the increase ofLaconcentration were observed. The leakage properties ofCBTithin films were found to be improved by theLadoping. The results were discussed with respect to the effects ofLa3+substitution at perovskite A-site.

Suggested Citation

  • Yanxia Ding & Guangda Hu & Suhua Fan, 2007. "EFFECTS OFLaDOPING ON FERROELECTRIC PROPERTIES OFCaBi4Ti4O15THIN FILMS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 14(02), pages 277-281.
  • Handle: RePEc:wsi:srlxxx:v:14:y:2007:i:02:n:s0218625x07009360
    DOI: 10.1142/S0218625X07009360
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