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Effect Of Pre-Heating Temperature On The Characteristics Of Pzt Thin Films Grown By Using A Triol Sol–Gel Route

Author

Listed:
  • SARAWUT THOUNTOM

    (Department of Physics, Faculty of Science, Chiang Mai University, Chiang Mai 50200, Thailand)

  • MANOCH NAKSATA

    (Department of Physics, Faculty of Science, Chiang Mai University, Chiang Mai 50200, Thailand)

  • KENNETH MACKENZIE

    (School of Chemical and Physical Sciences, Faculty of Science, Victoria University of Wellington, Wellington 6005, New Zealand)

  • TAWEE TUNKASIRI

    (Department of Physics, Faculty of Science, Chiang Mai University, Chiang Mai 50200, Thailand)

Abstract

Lead zirconate titanate (PZT) films with compositions near the morphotropic phase boundary were fabricated onPt(111)/Ti/SiO2/Si(100)using the triol sol–gel method. The effect of the pre-heating temperature on the phase transformations, microstructures, electrical properties, and ferroelectric properties of the PZT thin films was investigated. Randomly oriented PZT thin films pre-heated at 400°C for 10 min and annealed at 600°C for 30 min showed well-defined ferroelectric hysteresis loops with a remnant polarization of 26.57 μC/cm2and a coercive field of 115.42 kV/cm. The dielectric constant and dielectric loss of the PZT films were 621 and 0.0395, respectively. The microstructures of the thin films are dense, crack-free, and homogeneous with fine grains about 15–20 nm in size.

Suggested Citation

  • Sarawut Thountom & Manoch Naksata & Kenneth Mackenzie & Tawee Tunkasiri, 2007. "Effect Of Pre-Heating Temperature On The Characteristics Of Pzt Thin Films Grown By Using A Triol Sol–Gel Route," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 14(02), pages 229-234.
    • Handle: RePEc:wsi:srlxxx:v:14:y:2007:i:02:n:s0218625x0700930x
    DOI: 10.1142/S0218625X0700930X
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