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Atomic Structure Analysis Of Ultra Thin Iron Silicide Films By Stereo Atomscope

Author

Listed:
  • K. KATAOKA

    (Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan)

  • F. MATSUI

    (Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan;
    CREST-JST, Kawaguchi, Saitama 332-0012, Japan)

  • Y. KATO

    (Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan)

  • F. Z. GUO

    (Japan Synchrotron Radiation Research Institute, SPring-8, Mikazuki, Hyogo 679-5198, Japan)

  • T. MATSUSHITA

    (Japan Synchrotron Radiation Research Institute, SPring-8, Mikazuki, Hyogo 679-5198, Japan)

  • K. HATTORI

    (Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan;
    CREST-JST, Kawaguchi, Saitama 332-0012, Japan)

  • H. DAIMON

    (Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan;
    CREST-JST, Kawaguchi, Saitama 332-0012, Japan)

Abstract

Three-dimensional atomic arrangements of ultra thinFesilicide films were directly revealed. By using circularly polarized light with opposite helicities, forward focusing peaks with their positions shifted in photoelectron angular distribution (PEAD) patterns can be obtained. We successfully observed the PEAD patterns of ultra thinFesilicide films from different core levels ofFeandSiatoms by display-type spherical mirror analyzer (DIANA). The element selective stereo photographs indicate similar hexagonal atomic arrangement with three-fold symmetry forSiandFeatoms, which is consistent with a model based on aCsCl-type structure with B-type stacking. This is the first observation of stereoscopic atomic arrangements for ultra thin compound films, which implies that the stereo atomscope is very powerful structure analysis tool also for complex structures on surface.

Suggested Citation

  • K. Kataoka & F. Matsui & Y. Kato & F. Z. Guo & T. Matsushita & K. Hattori & H. Daimon, 2006. "Atomic Structure Analysis Of Ultra Thin Iron Silicide Films By Stereo Atomscope," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 13(02n03), pages 209-214.
    • Handle: RePEc:wsi:srlxxx:v:13:y:2006:i:02n03:n:s0218625x06008141
    DOI: 10.1142/S0218625X06008141
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