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STRUCTURE AND CHARACTERIZATION OFZnOTHIN FILM PREPARED BY SPIN COATING

Author

Listed:
  • GUANGPENG MA

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

  • JIANRU HAN

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

  • CHANGHONG YANG

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

  • HONGYAN XU

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

  • DONGMEI YANG

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

  • SHENGLI GU

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

  • FIYI JIANG

    (State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China)

Abstract

ZnOthin films were prepared on silica glass substrates by a sol–gel spin coating technique. The thickness of the films was about 200 nm. At 370 nm in the ultraviolet region, there is a sharp absorption edge that corresponds to theZnOintrinsic band gap of 3.30 eV. The structural properties of the films were examined by X-ray diffraction, which demonstrates that theZnOfilms werec-axis oriented. From the infrared spectrum, we conclude thatZnOwas deposited on silica glass substrates through a high temperature process at 700°C.

Suggested Citation

  • Guangpeng Ma & Jianru Han & Changhong Yang & Hongyan Xu & Dongmei Yang & Shengli Gu & Fiyi Jiang, 2006. "STRUCTURE AND CHARACTERIZATION OFZnOTHIN FILM PREPARED BY SPIN COATING," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 13(01), pages 13-15.
    • Handle: RePEc:wsi:srlxxx:v:13:y:2006:i:01:n:s0218625x06007779
    DOI: 10.1142/S0218625X06007779
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