Author
Listed:
- M. RUSOP
(Institute of Science, Universiti Teknologi Mara, 40450 Shah Alam, Selangor, Malaysia)
- S. ABDULLAH
(Institute of Science, Universiti Teknologi Mara, 40450 Shah Alam, Selangor, Malaysia)
- J. PODDER
(Department of Physics, Bangladesh University of Engineering and Technology, Dhaka 1000, Bangladesh)
- T. SOGA
(Department of Environmental Technology and Urban Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan)
- T. JIMBO
(Research Center for Nano-Device and System, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan)
Abstract
Nitrogenated diamond-like carbon films have been deposited on glass and p-typeSi(100) substrates by radio frequency (r.f.) plasma-enhanced chemical vapor deposition (PECVD) with a frequency of 13.56 MHz at room temperature usingCH4as precursor of carbon source andH2as a carrier gas. The deposition was performed at a different flow rate of nitrogen from 0 to 12 sccm under a constant r.f. power. The effect of nitrogen incorporation on the bonding states and growth kinetics of the deposited films have been investigated by Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, X-ray photoelectron spectroscopy and optical properties by UV spectroscopy measurement. Our experimental results show that the incorporation of nitrogen has a considerable effect on the properties of the deposited films. FTIR spectra show that the nitrogen is bonded to carbon and hydrogen asC=N,C≡N,N–HandC–Hbonding configurations in the as-deposited film. The incorporation of nitrogen is found to shift the Raman G peak toward the higher wave number and to increase the RamanID/IGratio demonstrating the graphitic character of the hydrogenated amorphous carbon–nitrogen films. Band gap is found to reduce with the increase in nitrogen concentration.
Suggested Citation
M. Rusop & S. Abdullah & J. Podder & T. Soga & T. Jimbo, 2006.
"OPTICAL AND STRUCTURAL PROPERTIES OF NITROGENATED DIAMOND-LIKE CARBON FILMS PREPARED BYr.f.PECVD,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 13(01), pages 1-6.
Handle:
RePEc:wsi:srlxxx:v:13:y:2006:i:01:n:s0218625x06007755
DOI: 10.1142/S0218625X06007755
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