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The Influence Of Humidity On The Shear Force Between Tip And Sample In Nsom Using Piezoelectric Fork

Author

Listed:
  • TIANHAO ZHANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • ZHEYU FANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • JIANYA ZHENG

    (Modern Physics Lab, College of Physics Science, Nankai University, Tianjin, 300071, P. R. China)

  • LIMO GAO

    (Modern Physics Lab, College of Physics Science, Nankai University, Tianjin, 300071, P. R. China)

  • HAIDONG YANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • MEIRONG YIN

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • JIA YANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • YANZHEN LU

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • HUIZHEN KANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • DAPENG YANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

  • HUIZHAN YANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, and Tianjin Key Lab of Photonics Materials and Technology for Information Science, Nankai University, Tianjin, 300071, P. R. China)

Abstract

The distance between tip and sample can be regulated using piezoelectric quartz fork glued with micro optic fiber probe. A biquadrate vibration equation for the fork–probe–sample system is established to theoretically analyze the relations of the electric current flow through fork versus tip–sample (T–S) distance(I–d). TheI–dcurve and the action distance for shear force are influenced by environmental humidity. The results reinforce the opinions in the earlier works by other researches that the physical origin of the shear force is due to a material filling the tip–sample gap. Furthermore, the intrinsic reasons for shear force damping between tip and sample have been confirmed and developed, i.e. the water and hydrocarbon coupled between optic fiber probe and sample due to the capillary cohesion force.

Suggested Citation

  • Tianhao Zhang & Zheyu Fang & Jianya Zheng & Limo Gao & Haidong Yang & Meirong Yin & Jia Yang & Yanzhen Lu & Huizhen Kang & Dapeng Yang & Huizhan Yang, 2005. "The Influence Of Humidity On The Shear Force Between Tip And Sample In Nsom Using Piezoelectric Fork," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 12(03), pages 355-358.
    • Handle: RePEc:wsi:srlxxx:v:12:y:2005:i:03:n:s0218625x05007116
    DOI: 10.1142/S0218625X05007116
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