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Contribution Of The Morphological Grain Sizes To The Electrical Resistivity Of Platinum And Gold Thin Films

Author

Listed:
  • M. CATTANI

    (Instituto de Física, Universidade de São Paulo, C. P. 66318, CEP 05315-970, São Paulo, SP, Brazil)

  • M. C. SALVADORI

    (Instituto de Física, Universidade de São Paulo, C. P. 66318, CEP 05315-970, São Paulo, SP, Brazil)

Abstract

We have measured the morphological grain sizes of nanostructured platinum and gold thin films. In previous works their electrical resistivities have been measured and a theoretical approach was proposed to explain the resistivity experimental data. It will be shown that within the framework of our theoretical approach, the morphological grain sizes play an essential role in the electrical resistivity of these metallic thin films.

Suggested Citation

  • M. Cattani & M. C. Salvadori, 2004. "Contribution Of The Morphological Grain Sizes To The Electrical Resistivity Of Platinum And Gold Thin Films," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 11(04n05), pages 463-467.
    • Handle: RePEc:wsi:srlxxx:v:11:y:2004:i:04n05:n:s0218625x04006396
    DOI: 10.1142/S0218625X04006396
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