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STUDY OF THEC2H4/Si(100)-(2×1)INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY

Author

Listed:
  • S. H. XU

    (Department of Physics, The University of Hong Kong, Hong Kong, China)

  • H. S. WU

    (Department of Physics, The University of Hong Kong, Hong Kong, China)

  • S. Y. TONG

    (Department of Physics and Materials Science, City University of Hong Kong, Hong Kong, China)

  • M. KEEFFE

    (Physics Department, Montana State University, Bozeman, MT 59717, USA)

  • G. J. LAPEYRE

    (Physics Department, Montana State University, Bozeman, MT 59717, USA)

  • E. ROTENBERG

    (Advanced Light Source, LBNL, Berkeley, CA 94720, USA)

Abstract

Thekderivative spectra (KDS) transform is used for construction of the three-dimensional atomic structure of theC2H4/Si(100)-(2×1)system from photoelectron diffraction data. The image function obtained by the KDS transform clearly observes the second-layer Si atoms and the C emitters apart from the first-layer Si atoms. The observations of the second-layer Si atoms and the C emitters make it easy to measure the C–C bond length correctly. Then a conclusive adsorption model — the di-σ model — for theC2H4/Si(100)-(2×1)system is established. In comparison with the KDS transform, the normal small-cone transform hardly measures the C–C bond length. The ability to observe more scatterers of a photoelectron emitter by the KDS transform expands the applicability of holographic imaging.

Suggested Citation

  • S. H. Xu & H. S. Wu & S. Y. Tong & M. Keeffe & G. J. Lapeyre & E. Rotenberg, 2003. "STUDY OF THEC2H4/Si(100)-(2×1)INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 10(06), pages 925-932.
  • Handle: RePEc:wsi:srlxxx:v:10:y:2003:i:06:n:s0218625x03005670
    DOI: 10.1142/S0218625X03005670
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