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Beamline for Surface and Interface Structures at SPring-8

Author

Listed:
  • O. Sakata

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • Y. Furukawa

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • S. Goto

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • T. Mochizuki

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • T. Uruga

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • K. Takeshita

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • H. Ohashi

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • T. Ohata

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • T. Matsushita

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • S. Takahashi

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • H. Tajiri

    (Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

  • T. Ishikawa

    (JASRI and Riken Harima Institute/SPring-8, Kouto, Mikazuki, 679-5148, Japan)

  • M. Nakamura

    (Keio University, Hiyoshi, Yokohama, 223-8522, Japan)

  • M. Ito

    (Keio University, Hiyoshi, Yokohama, 223-8522, Japan)

  • K. Sumitani

    (University of Tokyo, Kashiwa, Chiba, 277-8581, Japan)

  • T. Takahashi

    (University of Tokyo, Kashiwa, Chiba, 277-8581, Japan)

  • T. Shimura

    (Osaka University, Suita, Osaka 565-0871, Japan)

  • A. Saito

    (Osaka University, Suita, Osaka 565-0871, Japan)

  • M. Takahasi

    (Japan Atomic Energy Research Institute/SPring-8, Kouto, Mikazuki, 679-5198, Japan)

Abstract

The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt (111) surface.

Suggested Citation

  • O. Sakata & Y. Furukawa & S. Goto & T. Mochizuki & T. Uruga & K. Takeshita & H. Ohashi & T. Ohata & T. Matsushita & S. Takahashi & H. Tajiri & T. Ishikawa & M. Nakamura & M. Ito & K. Sumitani & T. Tak, 2003. "Beamline for Surface and Interface Structures at SPring-8," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 10(02n03), pages 543-547.
    • Handle: RePEc:wsi:srlxxx:v:10:y:2003:i:02n03:n:s0218625x03004809
    DOI: 10.1142/S0218625X03004809
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