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Angle-Resolved Soft X-Ray Photoemission For The Valence Band Of Graphite

Author

Listed:
  • TOMOHIRO MATSUSHITA

    (Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5198, Japan)

  • TAKAYUKI MURO

    (Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5198, Japan)

  • YUJI SAITOH

    (Synchrotron Radiation Research Center, Japan Atomic Energy Research Institute (JAERI), SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan)

  • TAKESHI NAKATANI

    (Synchrotron Radiation Research Center, Japan Atomic Energy Research Institute (JAERI), SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan)

  • AKIRA SEKIYAMA

    (Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama Toyonaka, Osaka 560-8531, Japan)

  • SHIGEMASA SUGA

    (Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama Toyonaka, Osaka 560-8531, Japan)

Abstract

Angle-resolved photoemission in the soft X-ray region has so far been used to study crystal (surface) structure by using photoelectron diffraction phenomena. In this energy region, the observation of the band structure was considered to be difficult, because the momentum of the incident photon cannot be negligible, the emitted electron is strongly influenced by the electron diffraction effects, and the cross section of the valence band is very small. We have performed the angle-resolved photoemission from the valence bands of highly oriented pyrolytic graphite by using the soft X-ray(hν=980eV)and successfully observed the band structure. The appearance of the structures of the band density of state is also discussed. Since the escape depth for the electrons with high kinetic energies is longer than ARUPS, this experimental method is better than the usual ARUPS in order to study the bulk band structures in solids.

Suggested Citation

  • Tomohiro Matsushita & Takayuki Muro & Yuji Saitoh & Takeshi Nakatani & Akira Sekiyama & Shigemasa Suga, 2002. "Angle-Resolved Soft X-Ray Photoemission For The Valence Band Of Graphite," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 1321-1326.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02003743
    DOI: 10.1142/S0218625X02003743
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