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PHOTOELECTRON SPECTRA OF SUBMONOLAYERC60F48FILMS ONd-METAL SUBSTRATES

Author

Listed:
  • N. YU. SVETCHNIKOV

    (Kurchatov Synchrotron Radiation Source, Russian Research Center Kurchatov Institute, Moscow 123182, Russian Federation)

  • A. A. KOLMAKOV

    (Kurchatov Synchrotron Radiation Source, Russian Research Center Kurchatov Institute, Moscow 123182, Russian Federation)

  • V. G. STANKEVITCH

    (Kurchatov Synchrotron Radiation Source, Russian Research Center Kurchatov Institute, Moscow 123182, Russian Federation)

Abstract

Photoemission valence band spectra of submonolayer fullereneC60F48films, evaporatedin situon d-metal foils of Au, Pt, Ta, W, Ni, were acquired under He II (40.8 eV) excitation at 300 K. Spectral structure transformations versus film thickness and substrate material were under investigation. For coverage ~ 0.5–1.0 MLC60F48the main spectral features were found to be close to those measured for thick films: with a main peak atEb≈ 9eV(F2p) and a broad peak at 11.4 eV (C2p or C2s). However, a new low intensity band withEb≈ 1.5eV(FWHM ≈ 1.4 eV) was found to arise at a film thickness of about 0.4–0.5 ML and to decrease beyond 1 ML. It may be attributed to a strong ion-covalent bonding between d-metal and fullerene at low coverage. For coverages exceeding 0.3 ML the spectra were found to be weakly dependent on substrate material, except for Ni, where this new band was found atEb= 2.2eVand the main peak atEb= 9.7eV.

Suggested Citation

  • N. Yu. Svetchnikov & A. A. Kolmakov & V. G. Stankevitch, 2002. "PHOTOELECTRON SPECTRA OF SUBMONOLAYERC60F48FILMS ONd-METAL SUBSTRATES," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 1269-1274.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02003688
    DOI: 10.1142/S0218625X02003688
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