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EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

Author

Listed:
  • P. LUCHES

    (INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy)

  • C. GIOVANARDI

    (INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy)

  • T. MOIA

    (INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy)

  • S. VALERI

    (INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy)

  • F. BRUNO

    (Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy)

  • L. FLOREANO

    (Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy)

  • R. GOTTER

    (Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy)

  • A. VERDINI

    (Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy)

  • A. MORGANTE

    (Laboratorio TASC–INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy;
    Dipartimento di Fisica, Università di Trieste, Via Valerio 2, 34127 Trieste, Italy)

  • A. SANTANIELLO

    (Sincrotrone Trieste, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy)

Abstract

CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

Suggested Citation

  • P. Luches & C. Giovanardi & T. Moia & S. Valeri & F. Bruno & L. Floreano & R. Gotter & A. Verdini & A. Morgante & A. Santaniello, 2002. "EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 937-941.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x0200324x
    DOI: 10.1142/S0218625X0200324X
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