IDEAS home Printed from https://ideas.repec.org/a/wsi/srlxxx/v09y2002i02ns0218625x02002956.html
   My bibliography  Save this article

An Analysis Of Electron–Hole Recombination In Solid Krypton Using Time-Resolved Vuv-Luminescence Sectroscopy

Author

Listed:
  • V. KISAND

    (Institute of Physics, University of Tartu, Riia 142, Tartu, 51014, Estonia)

  • M. KIRM

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, Hamburg, 22761, Germany)

  • S. VIELHAUER

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, Hamburg, 22761, Germany)

  • G. ZIMMERER

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, Hamburg, 22761, Germany)

Abstract

For the first time, the free exciton (FE) VUV-luminescence decay curves were systematically investigated in solid Kr using photoexcitation in the energy region above band gap energy. Delayed electron–hole recombination and "prompt" (in terms of the time resolution of the experimental setup) creation of secondary excitons were separated using the time-resolved experimental technique. A detailed model for the dynamics of electron–hole recombination into the FE state was developed. The delayed component of the free exciton decay curve was reproduced with model calculations, including thermalization of the carriers via scattering on acoustic phonons, and the recombination cross-section, which depends on the actual carrier temperatures. A satisfactory agreement between experiment and theory was found.

Suggested Citation

  • V. Kisand & M. Kirm & S. Vielhauer & G. Zimmerer, 2002. "An Analysis Of Electron–Hole Recombination In Solid Krypton Using Time-Resolved Vuv-Luminescence Sectroscopy," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 783-788.
  • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02002956
    DOI: 10.1142/S0218625X02002956
    as

    Download full text from publisher

    File URL: http://www.worldscientific.com/doi/abs/10.1142/S0218625X02002956
    Download Restriction: Access to full text is restricted to subscribers

    File URL: https://libkey.io/10.1142/S0218625X02002956?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02002956. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.