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MULTILAYER POLARIZERS FOR THE USE OF He-I AND He-II RESONANCE LINES

Author

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  • TADASHI HATANO

    (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan)

  • YUZI KONDO

    (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan)

  • KATSUHIKO SAITO

    (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan)

  • TAKEO EJIMA

    (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan)

  • MAKOTO WATANABE

    (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan)

  • MASAHIKO TAKAHASHI

    (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan)

Abstract

Multilayer polarizers for the use of He resonance lines have been developed. Si/Mg and SiC/Mg multilayers were designed and fabricated for the He-I and He-II resonance lines, respectively. The performance was checked by the use of synchrotron radiation. The polarizance ands-reflectance of the He-II polarizer measured at an angle of incidence of 40° were 0.98 and 41%, respectively. The polarizance of the He-I polarizer measured at an angle of incidence of 31.5° was 0.96.

Suggested Citation

  • Tadashi Hatano & Yuzi Kondo & Katsuhiko Saito & Takeo Ejima & Makoto Watanabe & Masahiko Takahashi, 2002. "MULTILAYER POLARIZERS FOR THE USE OF He-I AND He-II RESONANCE LINES," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 587-591.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02002695
    DOI: 10.1142/S0218625X02002695
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