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High Spatial Resolution Soft X-Ray Photoemission Study Ofwo3thin Films

Author

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  • L. LOZZI

    (INFM and Department of Physics, University of L'Aquila, via Vetoio, 67010 Coppito, L'Aquila, Italy)

  • M. PASSACANTANDO

    (INFM and Department of Physics, University of L'Aquila, via Vetoio, 67010 Coppito, L'Aquila, Italy)

  • S. SANTUCCI

    (INFM and Department of Physics, University of L'Aquila, via Vetoio, 67010 Coppito, L'Aquila, Italy)

  • S. LA ROSA

    (Sincrotrone Trieste S.p.A., Trieste, Italy)

  • N. YU. SVETCHNIKOV

    (Sincrotrone Trieste S.p.A., Trieste, Italy)

Abstract

WO3thin film surface chemical composition has been studied by means of high resolution soft X-ray photoemission spectroscopy. Valence band and W 4f core levels have been analyzed on different sample positions and high lateral resolution images have been acquired. The valence band spectra have shown for the first time a marked increase of the W 5d density of state at the Fermi level, indicating the presence of metallic tungsten on the surface. This has been confirmed by the W 4f signal, which presents both metallic and oxidized phases. For the first time, spectromicroscopy on core states has clearly evidenced the presence of nonstoichiometric areas and a spatial localization ofW4+states on the surface.

Suggested Citation

  • L. Lozzi & M. Passacantando & S. Santucci & S. La Rosa & N. Yu. Svetchnikov, 2002. "High Spatial Resolution Soft X-Ray Photoemission Study Ofwo3thin Films," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 375-380.
  • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02002518
    DOI: 10.1142/S0218625X02002518
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