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Optical Components For Polarization Analysis At The Vanadiuml3edge And The Carbon K Edge

Author

Listed:
  • H. GRIMMER

    (Paul Scherrer Institute, Laboratory for Neutron Scattering, CH-5234 Villigen PSI, Switzerland)

  • O. ZAHARKO

    (Paul Scherrer Institute, Laboratory for Neutron Scattering, CH-5234 Villigen PSI, Switzerland)

  • M. HORISBERGER

    (Paul Scherrer Institute, Laboratory for Neutron Scattering, CH-5234 Villigen PSI, Switzerland)

  • H.-CH. MERTINS

    (BESSY, Albert-Einstein-Strasse 15, D-12489 Berlin, Germany)

  • F. SCHÄFERS

    (BESSY, Albert-Einstein-Strasse 15, D-12489 Berlin, Germany)

Abstract

A complete polarization analysis of soft X-ray radiation with primary standards can be performed using a phase shifter in transmission and an analyzer in reflection. V/Ni multilayers produced at PSI by sputter deposition showed a phase shift|△| = 7.6°at 512 eV and a reflectance ratioRs/Rp> 1000forEin the range 507–512 eV. For Cr/C multilayers a phase shift|△| = 21°was found at 277 eV andRs= 20%,Rs/Rp= 1400at 278 eV. The values show that these components are suitable for polarization analysis at the mentioned energies.

Suggested Citation

  • H. Grimmer & O. Zaharko & M. Horisberger & H.-Ch. Mertins & F. Schäfers, 2002. "Optical Components For Polarization Analysis At The Vanadiuml3edge And The Carbon K Edge," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 481-485.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x0200249x
    DOI: 10.1142/S0218625X0200249X
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