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Differential Interference Contrast For X-Ray Microscopy: Fabrication And Characterization Of Twin Zone Plate Optics

Author

Listed:
  • ENZO DI FABRIZIO

    (LILIT, TASC-INFM, S.S.14 km 163.5 in Area Science Park, I-34012 Basovizza – Trieste, Italy)

  • BURKHARD KAULICH

    (X-Ray Microscopy Section, ELETTRA – Sincrotrone Trieste, S.S.14 km 163.5 in Area Science Park, I-34012 Basovizza – Trieste, Italy)

  • THOMAS WILHEIN

    (RheinAhrCampus Remagen, University of Applied Sciences, Suedallee 2, D-53424 Remagen, Germany)

  • JEAN SUSINI

    (ID21 X-Ray Microscopy Beamline, ESRF, BP 220, F-34073 Grenoble Cedex, France)

Abstract

A novel X-ray technique for converting the phase information of weakly absorbing specimen into strong image contrast similar to Nomarski differential interference contrast (DIC) is presented. DIC for X-rays is accomplished by the fabrication of a novel X-ray optic (TZP) consisting of two zone plates (ZPs) on both sides of the same substrate, laterally shifted by about one outermost zone width. The feasibility of DIC for X-rays was proven at the ID 21 X-ray microscopy beamline at the ESRF using a full-field imaging microscopeanda scanning transmission X-ray microscope, which were operated at 4 keV photon energy. In both microscopes, we observe a tremendous contrast enhancement of up to a factor of 25. Though first experiments were carried out at 4 keV photon energy, this X-ray DIC technique can be adapted to any photon energy where ZPs with appropriate parameters and imaging performance can be designed and manufactured.

Suggested Citation

  • Enzo Di Fabrizio & Burkhard Kaulich & Thomas Wilhein & Jean Susini, 2002. "Differential Interference Contrast For X-Ray Microscopy: Fabrication And Characterization Of Twin Zone Plate Optics," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 243-248.
  • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02001720
    DOI: 10.1142/S0218625X02001720
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