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TEMPERATURE-ACTIVATED REACTIONS OFH2OANDNH3WITH H-PASSIVATED Si(111) SURFACES

Author

Listed:
  • M. A. ZAÏBI

    (Laboratoire de Minéralogie-Cristallographie, UMR 7590 CNRS, Université Pierre et Marie Curie, 4 Place Jusssieu, 75252 Paris cedex 05, France)

  • C. A. SÉBENNE

    (Laboratoire de Minéralogie-Cristallographie, UMR 7590 CNRS, Université Pierre et Marie Curie, 4 Place Jusssieu, 75252 Paris cedex 05, France)

  • J. P. LACHARME

    (Laboratoire de Minéralogie-Cristallographie, UMR 7590 CNRS, Université Pierre et Marie Curie, 4 Place Jusssieu, 75252 Paris cedex 05, France)

Abstract

Chemically hydrogenated surfaces Si(111)(1×1)–H were exposed sequentially, at temperatures of up to 600°C, and to low pressures ofH2OorNH3. The interaction processes have been studied by low energy electron diffraction and by photoemission yield and Auger electron spectrometries. The temperature threshold forH2Oreaction is 350°C, at which, in a first stage, OH dipoles replace adsorbed H. OH dipole density is limited below 1/3 monolayer by the Si–O–Si formation, which brings disorder and restores H passivation. ForNH3, the reaction threshold is 370°C, at which only a small density ofNH2dipoles is stabilized at saturation. Beyond 370°C, the saturatedNH3/Si(111)–H reaction is characterised by an increasing substitution ofNH2dipoles to H atoms. At higher temperatures, the loss of hydrogen leads to surface disorder, which induces a loss of the N-related dipole moment normal to the surface.

Suggested Citation

  • M. A. Zaïbi & C. A. Sébenne & J. P. Lacharme, 2001. "TEMPERATURE-ACTIVATED REACTIONS OFH2OANDNH3WITH H-PASSIVATED Si(111) SURFACES," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 8(01n02), pages 25-31.
  • Handle: RePEc:wsi:srlxxx:v:08:y:2001:i:01n02:n:s0218625x01000914
    DOI: 10.1142/S0218625X01000914
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    Keywords

    ; 79.60.Dp; 68.45.Da; 68.35.Dv;
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