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OBSERVATION OF DIRECT-CURRENT-INDUCED STEP BENDING PATTERNS ONSi(001)

Author

Listed:
  • J.-F. NIELSEN

    (Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA)

  • J. P. PELZ

    (Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA)

  • M. S. PETTERSEN

    (Department of Physics and Astronomy, Otterbein College, Westerville, Ohio 43081, USA)

Abstract

Atomic force microscopy and optical microscopy were used to observe a novel "step bending" instability on vicinal Si(001) surfaces heated with direct current along a direction. This instability occurs on areas where the applied current is parallel to the average step direction and consists of wavy step undulations with a nonzero phase shift between adjacent steps, consistent with theoretical predictions by Liuet al.[Phys. Rev. Lett.81, 2743 (1998)]. The resulting "bands" of high step density run obliquely to the direction of the applied current. These step patterns were observed on spherically dimpled surfaces, which also exhibit a variety of other electromigration-induced instabilities.

Suggested Citation

  • J.-F. Nielsen & J. P. Pelz & M. S. Pettersen, 2000. "OBSERVATION OF DIRECT-CURRENT-INDUCED STEP BENDING PATTERNS ONSi(001)," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 7(05n06), pages 577-582.
    • Handle: RePEc:wsi:srlxxx:v:07:y:2000:i:05n06:n:s0218625x00000713
    DOI: 10.1142/S0218625X00000713
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