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Scanning Probe Microscopy Applied To Materials Science And Biology

Author

Listed:
  • PAOLO PERFETTI

    (Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy)

  • A. CRICENTI

    (Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy)

  • R. GENEROSI

    (Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy)

Abstract

A brief description of the scanning probe microscopies is given, with particular attention to atomic force microscopy (AFM) and near field optical microscopy (SNOM). We show examples of AFM used in friction mode and in topographic mode. The basic principles of SNOM are also presented, together with images obtained on artificial diamond films and on neuron networks.

Suggested Citation

  • Paolo Perfetti & A. Cricenti & R. Generosi, 2000. "Scanning Probe Microscopy Applied To Materials Science And Biology," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 7(04), pages 411-422.
    • Handle: RePEc:wsi:srlxxx:v:07:y:2000:i:04:n:s0218625x0000049x
    DOI: 10.1142/S0218625X0000049X
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