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X-Ray Diffraction For Surfaces And Buried Interfaces

Author

Listed:
  • G. RENAUD

    (Département de Recherche Fondamentale sur la Matière Condensée/SP2M/IRS, CEA Grenoble, 17 rue des martyrs, 38054 Grenoble Cédex 9, France)

Abstract

The application of X-rays to the structural characterization of surfaces and interfaces,in situand in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

Suggested Citation

  • G. Renaud, 2000. "X-Ray Diffraction For Surfaces And Buried Interfaces," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 7(04), pages 437-446.
    • Handle: RePEc:wsi:srlxxx:v:07:y:2000:i:04:n:s0218625x00000452
    DOI: 10.1142/S0218625X00000452
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