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Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

Author

Listed:
  • E. V. Blagov

    (Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia)

  • G. L. Klimchitskaya

    (North-West Polytechnical Institute, Department of Physics, Millionnaya str. 5, St. Petersburg, 191065, Russia)

  • V. M. Mostepanenko

    (Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia)

Abstract

The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

Suggested Citation

  • E. V. Blagov & G. L. Klimchitskaya & V. M. Mostepanenko, 1998. "Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(05), pages 989-996.
    • Handle: RePEc:wsi:srlxxx:v:05:y:1998:i:05:n:s0218625x98001341
    DOI: 10.1142/S0218625X98001341
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