Author
Listed:
- B. A. Joyce
(Interdisciplinary Research Centre for Semiconductor Materials, The Blackett Laboratory, Imperial College of Science, Technology and Medicine, Prince Consort Road, London SW7 2BZ, UK)
- J. Zhang
(Interdisciplinary Research Centre for Semiconductor Materials, The Blackett Laboratory, Imperial College of Science, Technology and Medicine, Prince Consort Road, London SW7 2BZ, UK)
- A. G. Taylor
(Interdisciplinary Research Centre for Semiconductor Materials, The Blackett Laboratory, Imperial College of Science, Technology and Medicine, Prince Consort Road, London SW7 2BZ, UK)
- A. K. Lees
(Interdisciplinary Research Centre for Semiconductor Materials, The Blackett Laboratory, Imperial College of Science, Technology and Medicine, Prince Consort Road, London SW7 2BZ, UK)
Abstract
Molecular beam epitaxy (MBE) provides an ideal experimental vehicle for thein situstudy of thin film growth dynamics. By using a combination of reflection high energy electron diffraction (RHEED) and reflectance anisotropy (difference) spectroscopy [RA(D)S], it is possible to separate morphological (long range order) and local electronic structure effects, which we demonstrate with the growth of silicon films from disilane(Si2H6)on Si(001)(2 × 1)+(1 × 2)reconstructed surfaces.The rate-limiting step in Si growth from both monosilane(SiH4)and disilane is the desorption of molecular hydrogen and we have found using RAS that, over a significant range of temperature and coverage, hydrogen desorption follows zeroth order kinetics as the result of a step-mediated process. Finally, we show how this influences the growth rate on substrates of differing degrees of vicinality.
Suggested Citation
B. A. Joyce & J. Zhang & A. G. Taylor & A. K. Lees, 1998.
"A Reflection High Energy Electron Diffraction–Reflectance Anisotropy Spectroscopy Study of Silicon Growth Dynamics During Gas Source Molecular Beam Epitaxy from Silanes,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(03n04), pages 761-767.
Handle:
RePEc:wsi:srlxxx:v:05:y:1998:i:03n04:n:s0218625x98001146
DOI: 10.1142/S0218625X98001146
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