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Synchrotron Radiation FTIR Spectroscopic Studies of Water on Ni(110)

Author

Listed:
  • M. Kovar

    (Interface Science Western and Department of Chemistry, The University of Western Ontario, London, Ontario, N6A 5B7, Canada)

  • R. V. Kasza

    (Interface Science Western and Department of Chemistry, The University of Western Ontario, London, Ontario, N6A 5B7, Canada)

  • K. Griffiths

    (Interface Science Western and Department of Chemistry, The University of Western Ontario, London, Ontario, N6A 5B7, Canada)

  • P. R. Norton

    (Interface Science Western and Department of Chemistry, The University of Western Ontario, London, Ontario, N6A 5B7, Canada)

  • G. P. Williams

    (National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA)

  • D. Van Campen

    (National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA)

Abstract

The adsorption of water on Ni(110) at 92-230 K has been studied by Fourier transform infrared reflection-absorption spectroscopy (FTIR-RAS) in the 200-2000 cm-lfrequency range using a synchrotron radiation source. For water adsorbed at 90-180 K and coverageθ(0≤θ≤0.5monolayers), two IR bands at frequencies of ~ 667 and 806 cm-1can always be observed despite the absence of an O–H stretch band. For water adsorbed at 180 K followed by annealing to 230 K, two IR bands are again observed, at 767 and 947 cm-1. In both cases we attribute the bands to water wagging and rocking modes. At 180 K, they are rather broad and indicative of interactions in the orderedc(2 × 2)water layer; long range dipole–dipole interactions could be important in stabilizing this 0.5 ML structure at 180 K. At 230 K the bands are believed to originate from the water molecules in water-hydroxyl complexes which occur in well-ordered 2 × 1 islands.

Suggested Citation

  • M. Kovar & R. V. Kasza & K. Griffiths & P. R. Norton & G. P. Williams & D. Van Campen, 1998. "Synchrotron Radiation FTIR Spectroscopic Studies of Water on Ni(110)," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(02), pages 589-598.
    • Handle: RePEc:wsi:srlxxx:v:05:y:1998:i:02:n:s0218625x98000979
    DOI: 10.1142/S0218625X98000979
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