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Negative Ion Resonance Evidenced by Vibrationally Resolved Electron Diffraction On the H/Si(111) Surface

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  • Y. He

    (Laboratoire Interdisciplinaire de Spectroscopie Electronique, Institute for Studies in Interface Sciences, Facultés Universitaires Notre-Dame de la Paix, 61, rue de Bruxelles, B-5000 Namur, Belgium)

  • L.-M. Yu

    (Laboratoire Interdisciplinaire de Spectroscopie Electronique, Institute for Studies in Interface Sciences, Facultés Universitaires Notre-Dame de la Paix, 61, rue de Bruxelles, B-5000 Namur, Belgium)

  • P. A. Thiry

    (Laboratoire Interdisciplinaire de Spectroscopie Electronique, Institute for Studies in Interface Sciences, Facultés Universitaires Notre-Dame de la Paix, 61, rue de Bruxelles, B-5000 Namur, Belgium)

  • R. Caudano

    (Laboratoire Interdisciplinaire de Spectroscopie Electronique, Institute for Studies in Interface Sciences, Facultés Universitaires Notre-Dame de la Paix, 61, rue de Bruxelles, B-5000 Namur, Belgium)

Abstract

The surface vibrations of H-terminated Si(111) are investigated by high resolution electron energy loss spectroscopy (HREELS). Clear evidence is obtained for reassigning the electron resonant scattering from a surface resonance to a negative ion resonance mechanism. Since the electrons emitted from the trapping states show characteristic angular diffraction patterns realated with the geometric and vibrational symmetries of the surface, we suggest the possibility of using this system to investigate vibrationally resolved electron diffraction processes.

Suggested Citation

  • Y. He & L.-M. Yu & P. A. Thiry & R. Caudano, 1998. "Negative Ion Resonance Evidenced by Vibrationally Resolved Electron Diffraction On the H/Si(111) Surface," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(01), pages 63-67.
    • Handle: RePEc:wsi:srlxxx:v:05:y:1998:i:01:n:s0218625x98000141
    DOI: 10.1142/S0218625X98000141
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