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Evolution and Degeneration of Dimer-Adatom-Stacking-Fault Structure in Solid-Phase Epitaxy on Si(111) Surface Observed by Scanning Tunneling Microscopy

Author

Listed:
  • Z. Zhang

    (Universität der Bundeswehr München, Fakultät für Elektrotechnik, Institute für Physik, D-85577 Neubiberg, Germany)

  • M. A. Kulakov

    (Universität der Bundeswehr München, Fakultät für Elektrotechnik, Institute für Physik, D-85577 Neubiberg, Germany)

  • B. Bullemer

    (Universität der Bundeswehr München, Fakultät für Elektrotechnik, Institute für Physik, D-85577 Neubiberg, Germany)

Abstract

Large unit cells of dimer-adatom-stacking-fault structure and related2 × 2and c(4 × 2) reconstructions have been prepared by low-temperature solid-phase epitaxy and observed by scanning tunneling microscopy. The size-different unit cells of the DAS structure are considered to be a structure evolution in which more electron charge transfers in a larger unit cell from the adatom dangling bonds to the rest-atom dangling bonds. In some cases the DAS structure can degenerate into triangular2 × 2domains and bundlinke c(4 × 2) domains. The rest atoms are always fully filled by electrons due to the charge transfer. The adatom dangling bonds are partially filled in a c(4 × 2) symmetry and essentially empty in a2 × 2symmetry. As a result, the rest atoms in2 × 2domains can be imaged without the adatom protrusions while in the c(4 × 2) domains the protrusions of the adatoms and the rest atoms appear in zigzag chains, when the sample is negatively biased.

Suggested Citation

  • Z. Zhang & M. A. Kulakov & B. Bullemer, 1998. "Evolution and Degeneration of Dimer-Adatom-Stacking-Fault Structure in Solid-Phase Epitaxy on Si(111) Surface Observed by Scanning Tunneling Microscopy," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(01), pages 21-25.
  • Handle: RePEc:wsi:srlxxx:v:05:y:1998:i:01:n:s0218625x98000074
    DOI: 10.1142/S0218625X98000074
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