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A SEXAFS STUDY OF ULTRATHINCrFILMS

Author

Listed:
  • J. C. COOK

    (Department of Chemistry, University of York, Heslington, York, YO1 5DD, UK;)

  • M. DOWLING

    (Department of Physics, HH Wills Laboratory, University of Bristol, Bristol BS5 1TH, UK)

  • W. SCHWARZACHER

    (Department of Physics, HH Wills Laboratory, University of Bristol, Bristol BS5 1TH, UK)

  • E. M. McCASH

    (Department of Chemistry, University of York, Heslington, York, YO1 5DD, UK)

Abstract

Three types ofCrfilms were grown on Pd(100) at different substrate temperatures. The film thickness was found to be the crucial parameter in determining the film structure; substrate temperature was found to make little difference to the surface EXAFS pattern observed. Films with a thickness greater than 6 monolayers (ML) of Cr were body-centered-cubic (bcc); those with a thickness less than 3 ML Cr appear to be face-centered-cubic (fcc) and those in between were initially bcc but after annealing to ~500 K produced an fcc-like SEXAFS pattern. The SEXAFS of both thin and medium films can be interpreted in terms of a Cr–Pd alloy on the surface.

Suggested Citation

  • J. C. COOK & M. DOWLING & W. SCHWARZACHER & E. M. McCASH, 1997. "A SEXAFS STUDY OF ULTRATHINCrFILMS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 4(06), pages 1257-1261.
    • Handle: RePEc:wsi:srlxxx:v:04:y:1997:i:06:n:s0218625x97001632
    DOI: 10.1142/S0218625X97001632
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