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A Ray Tracing Method To Describe The Angular Profiles Of Diffraction Rods In Surface X Ray Experiments

Author

Listed:
  • X. TORRELLES

    (European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France)

  • J. ALVAREZ

    (European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France)

  • S. FERRER

    (European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France)

Abstract

The accurate determination of the coordinates normal to the surface in X ray diffraction experiments requires measuring up to high exit angles. Under these conditions some instrumental and geometrical effects related to the dimensions of the detector slits and the location in the Ewald sphere of the outgoing beam may complicate the analysis of the data. We have developed a method based on the ray tracing technique to investigate the appropriate corrections. Examples for Ge(001)-(2×1) are presented.

Suggested Citation

  • X. Torrelles & J. Alvarez & S. Ferrer, 1997. "A Ray Tracing Method To Describe The Angular Profiles Of Diffraction Rods In Surface X Ray Experiments," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 4(05), pages 1035-1038.
    • Handle: RePEc:wsi:srlxxx:v:04:y:1997:i:05:n:s0218625x97001243
    DOI: 10.1142/S0218625X97001243
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