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The Importance Of Strain Analysis In Studies Of Pseudomorphic Growth

Author

Listed:
  • F. JONA

    (Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794-2275, USA)

  • P. M. MARCUS

    (Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794-2275, USA)

Abstract

Since a pseudomorphic film is usually strained both in the plane of the surface and in the perpendicular direction, strain analysis is necessary in order to determine the strains and identify the equilibrium (i.e. the unstrained) phase of the film material. A procedure for carrying out the strain analysis within the limits of linear elasticity theory is described by way of a simple hypothetical example with cubic {001} surfaces, which illustrates the concept of epitaxial lines. These are lines relating the perpendicular spacing between atomic planes, as produced by epitaxial strain on a stable or metastable crystal phase, to the in-plane spacing in pseudomorphic films.

Suggested Citation

  • F. Jona & P. M. Marcus, 1997. "The Importance Of Strain Analysis In Studies Of Pseudomorphic Growth," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 4(05), pages 817-820.
    • Handle: RePEc:wsi:srlxxx:v:04:y:1997:i:05:n:s0218625x97000821
    DOI: 10.1142/S0218625X97000821
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