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HOLOGRAPHY WITH KIKUCHI ELECTRONS: DIRECT IMAGING OF ORDERED TRIMERS ON${\rm A{\lc u}/S{\lc i}(111)}(\sqrt{3}\times \sqrt{3})$R30° AND${\rm S{\lc b}/S{\lc i}(111)}(\sqrt{3}\times \sqrt{3})$R30° INTERFACES

Author

Listed:
  • I. H. HONG

    (Research Division, Synchrotron Radiation Research Center, Hsinchu, Taiwan, R.O.C.)

  • M. C. JIH

    (Department of Physics and Materials Science Research Center, Tsing Hua University, Hsinchu, Taiwan, R.O.C.)

  • Y. C. CHOU

    (Department of Physics and Materials Science Research Center, Tsing Hua University, Hsinchu, Taiwan, R.O.C.)

  • C. M. WEI

    (Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan, R.O.C.)

Abstract

The structural bases on the metal/semiconductor interfaces, such as gold trimers on the${\rm Au/Si(111)}(\sqrt{3}\times\sqrt{3})$R30° surface and antimony trimers on the${\rm Sb/Si(111)}(\sqrt{3}\times\sqrt{3})$R30° surface, can be imaged directly with a simple inversion of low-energy (>600 eV) Kikuchi-electron patterns (Kikuchi-electron holography—KEH). The relative positions of the building blocks (trimers) on the adsorbates to the substrate atoms are also determined. This short-range-order KEH tool, which provides the 3D Patterson function, can be viewed as a twin of grazing-incidence X-ray diffraction. Using direct structural information obtained by KEH, one can greatly reduce the tested models in a complete trial-and-error structural-determination process.

Suggested Citation

  • I. H. Hong & M. C. Jih & Y. C. Chou & C. M. Wei, 1997. "HOLOGRAPHY WITH KIKUCHI ELECTRONS: DIRECT IMAGING OF ORDERED TRIMERS ON${\rm A{\lc u}/S{\lc i}(111)}(\sqrt{3}\times \sqrt{3})$R30° AND${\rm S{\lc b}/S{\lc i}(111)}(\sqrt{3}\times \sqrt{3})$R30° INTERF," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 4(04), pages 733-756.
  • Handle: RePEc:wsi:srlxxx:v:04:y:1997:i:04:n:s0218625x97000730
    DOI: 10.1142/S0218625X97000730
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