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Investigation Of Symmetry Properties Of Surfaces By Means Of Backscattered Electrons

Author

Listed:
  • M. ERBUDAK

    (Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland)

  • M. HOCHSTRASSER

    (Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland)

  • E. WETLI

    (Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland;
    Present address: Physikinstitut, Universität Zürich–Irchel, CH-8057 Zürich, Switzerland)

  • M. ZURKIRCH

    (Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule, CH-8093 Zürich, Switzerland)

Abstract

Secondary-electron imaging is presented as a practical method which allows investigation of the near-surface structure in real time. It is based on the observation that electrons backscattered from surfaces in the keV range show a strong enhancement of intensity along directions defined by atomic rows. The spatial imaging of such electrons reveals the symmetry of near-surface regions in real space. Three-dimensional views of the solid are readily obtained, which makes this method ideally suited for the study of unknown structures and any material system where there is a change of symmetry.

Suggested Citation

  • M. Erbudak & M. Hochstrasser & E. Wetli & M. Zurkirch, 1997. "Investigation Of Symmetry Properties Of Surfaces By Means Of Backscattered Electrons," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 4(01), pages 179-196.
    • Handle: RePEc:wsi:srlxxx:v:04:y:1997:i:01:n:s0218625x97000183
    DOI: 10.1142/S0218625X97000183
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