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CHARACTERIZATION AND OPTICAL PROPERTIES OFAu/SiO2COMPOSITE THIN FILMS

Author

Listed:
  • I. TANAHASHI

    (Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan)

  • M. YOSHIDA

    (Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan)

  • Y. MANABE

    (Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan)

  • T. TOHDA

    (Central Research Laboratories, Matsushita Electric Industrial Co. Ltd., Hikaridai, Seika-cho, Kyoto 619–02, Japan)

Abstract

Au/SiO2composite thin films were prepared by a multitarget sputtering method. The multilayer structure where the Au-particle layer was sandwiched betweenSiO2layer was clearly observed in the as-deposited film by the cross-sectional TEM. The diameter of the Au particles in the film was estimated to be 2–3 nm and it began to increase when the film was heat-treated above 700° C. The diameter was proportional to the cube root of the heat-treatment time, suggesting that the Au particles grew in the supersaturated solid solution. In the optical absorption spectra of the films, the absorption peak due to the surface-plasmon resonance of Au particles was observed at the wavelength of 528–544 nm. With increasing mean diameter of Au particles, the peak intensity became large and the full-width-at-half-maximum of the absorption band was decreased from 130 nm to 80 nm.

Suggested Citation

  • I. Tanahashi & M. Yoshida & Y. Manabe & T. Tohda, 1996. "CHARACTERIZATION AND OPTICAL PROPERTIES OFAu/SiO2COMPOSITE THIN FILMS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 3(01), pages 1071-1076.
    • Handle: RePEc:wsi:srlxxx:v:03:y:1996:i:01:n:s0218625x96001911
    DOI: 10.1142/S0218625X96001911
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