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Correlation Between Free-Cluster Properties And Thin Films Elaborated By Low-Energy Cluster-Beam Deposition

Author

Listed:
  • P. MÉLINON

    (Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

  • V. PAILLARD

    (Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

  • V. DUPUIS

    (Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

  • J.P. PEREZ

    (Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

  • J. TUAILLON

    (Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

  • A. PEREZ

    (Département de Physique des Matériaux, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

  • B. BARBARA

    (Laboratoire de Magnétisme Laboratoire Louis Néel, CNRS BP 166X, 38042 Grenoble Cedex, France)

  • L. THOMAS

    (Laboratoire de Magnétisme Laboratoire Louis Néel, CNRS BP 166X, 38042 Grenoble Cedex, France)

  • M. BOUDEULLE

    (Laboratoire de Physico-Chimie des Matériaux Luminescents, 43 Bd du 11 Nov 1918, F-69622 Villeurbanne Cedex, France)

Abstract

The properties of thin films obtained by low-energy cluster-beam deposition are reviewed. The main characteristics are the nanoscale granular structure and the memory effect of the free-cluster properties. The first point is evidenced by the specific magnetic properties of transition-metal films, which are intermediate between amorphous and bulk phases, while the second point is illustrated from carbon films exhibiting the electronic structure of the free carbon cluster.

Suggested Citation

  • P. Mélinon & V. Paillard & V. Dupuis & J.P. Perez & J. Tuaillon & A. Perez & B. Barbara & L. Thomas & M. Boudeulle, 1996. "Correlation Between Free-Cluster Properties And Thin Films Elaborated By Low-Energy Cluster-Beam Deposition," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 3(01), pages 1007-1011.
    • Handle: RePEc:wsi:srlxxx:v:03:y:1996:i:01:n:s0218625x96001807
    DOI: 10.1142/S0218625X96001807
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