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Mass Spectra And Dissociation Patterns Of Tellurium Clusters Using Positive And Negative Secondary-Ion Mass Spectrometry

Author

Listed:
  • H. ITO

    (Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka 560, Japan)

  • T. SAKURAI

    (Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka 560, Japan)

  • T. MATSUO

    (Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka 560, Japan)

  • T. ICHIHARA

    (Department of Earth and Space Sciences, Faculty of Science, Osaka University, Toyonaka, Osaka 560, Japan)

  • I. KATAKUSE

    (Department of Earth and Space Sciences, Faculty of Science, Osaka University, Toyonaka, Osaka 560, Japan)

Abstract

Size distribution of positive and negative tellurium clusters in the size range from 2 to 56 atoms was investigated by secondary-ion mass spectrometry (SIMS). Cluster ions were produced by the 12-keVXe+ions bombardment of a sample tellurium sheet and were mass-analyzed using sector-type double-focusing mass spectrometers. It was found that a discontinuous variation of cluster-ion intensity appeared at specific numbers of n. These numbers were 5, 8, 12, 15, 19, and 23 for positive clusters and 6, 10, 13, and 16 for negative clusters. The dissociation pattern was also investigated by an acceleration-voltage scanning method. It was found thatTe2,Te5, andTe6fragmentation events occurred at a large probability. Observation of specific fragmentation patterns suggested the existence of nonsequential fragment channels.

Suggested Citation

  • H. Ito & T. Sakurai & T. Matsuo & T. Ichihara & I. Katakuse, 1996. "Mass Spectra And Dissociation Patterns Of Tellurium Clusters Using Positive And Negative Secondary-Ion Mass Spectrometry," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 3(01), pages 577-582.
    • Handle: RePEc:wsi:srlxxx:v:03:y:1996:i:01:n:s0218625x96001042
    DOI: 10.1142/S0218625X96001042
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