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DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY INNi(1 ML)/Pt(111)BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION

Author

Listed:
  • M. SAMBI

    (Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy)

  • E. PIN

    (Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy)

  • G. GRANOZZI

    (Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy)

Abstract

The site (fcc or hcp) occupied by the atoms of aNi MLdeposited onPt(111)is determined in this paper using angle-scanned photoelectron diffraction (PD). A full 2πMgKα-excitedNi-2p3/2PD pattern from1-ML Nideposited on Pt(111) is compared to single scattering cluster-spherical wave (SSC-SW) simulations and the agreement between experimental and theoretical data is quantified by R-factor analysis. From the present investigation it turns out that Ni atoms occupy hcp sites. In addition, theNi-Ptdistance has been estimated to be2.5±0.1 Å.

Suggested Citation

  • M. Sambi & E. Pin & G. Granozzi, 1995. "DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY INNi(1 ML)/Pt(111)BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 2(06), pages 787-793.
    • Handle: RePEc:wsi:srlxxx:v:02:y:1995:i:06:n:s0218625x95000716
    DOI: 10.1142/S0218625X95000716
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