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Surface Studies By Core-Excitation Reflection Electron Energy Loss Spectroscopy

Author

Listed:
  • A.P. HITCHCOCK

    (Department of Chemistry and Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada L8S 4M1, Canada)

  • T. TYLISZCZAK

    (Department of Chemistry and Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada L8S 4M1, Canada)

Abstract

Inelastic electron scattering in a reflection geometry is a useful alternative to synchrotron radiation X-ray absorption spectroscopy for inner-shell excitation studies of surfaces. This article reviews the current capabilities of reflection electron energy loss spectroscopy for core-excitation studies of the electronic and geometric structure of surfaces. Issues discussed include: momentum transfer dependence, comparison to X-ray techniques, orientational sensitivity, spatial and energy resolution, and technological applications. Examples of applications to clean surfaces, atomic and molecular adsorbates, and thin films are given.

Suggested Citation

  • A.P. Hitchcock & T. Tyliszczak, 1995. "Surface Studies By Core-Excitation Reflection Electron Energy Loss Spectroscopy," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 2(01), pages 43-61.
    • Handle: RePEc:wsi:srlxxx:v:02:y:1995:i:01:n:s0218625x95000054
    DOI: 10.1142/S0218625X95000054
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