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THE DYNAMICS OF DEUTERIUM ADSORPTION ON Pt{100} AND THE ROLE OF ADSORBATE-INDUCED DEFECTS

Author

Listed:
  • ST. J. DIXON-WARREN

    (Department of Chemistry, University of Cambridge, Cambridge CB2 1EW, UK)

  • A.T. PASTEUR

    (Department of Chemistry, University of Cambridge, Cambridge CB2 1EW, UK)

  • D.A. KING

    (Department of Chemistry, University of Cambridge, Cambridge CB2 1EW, UK)

Abstract

The dissociative initial sticking probability,s0, for deuterium on Pt{100}-hex has been measured as a function of beam kinetic energy,Ek, and substrate temperature,TS. AtTS=150 K, s was found to increase with increasingEkconsistent with direct activated adsorption; the increase is approximately linear. AtEk=0.063eV,s0is independent of substrate temperature(s0≈0.07)over the range 150 to 1000 K, also consistent with a direct adsorption process. We present evidence for an increase ofs0due to adsorbate-induced defects. These defects survive annealing to 500 K but do not survive annealing to 1030 K. We have also measured s forD2on the(1×1)bulk truncated surface, and find it to be similar to that for the hex-reconstructed phase.

Suggested Citation

  • St. J. Dixon-Warren & A.T. Pasteur & D.A. King, 1994. "THE DYNAMICS OF DEUTERIUM ADSORPTION ON Pt{100} AND THE ROLE OF ADSORBATE-INDUCED DEFECTS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 1(04), pages 593-596.
  • Handle: RePEc:wsi:srlxxx:v:01:y:1994:i:04:n:s0218625x94000746
    DOI: 10.1142/S0218625X94000746
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