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Cascading failures mechanism based on betweenness-degree ratio distribution with different connecting preferences

Author

Listed:
  • Xiao Juan Wang

    (Beijing University of Posts and Telecommunications, Electronic Engineering Institute, Beijing 100876, P. R. China)

  • Shi Ze Guo

    (Beijing University of Posts and Telecommunications, Computer Institute, Beijing 100876, P. R. China)

  • Lei Jin

    (Beijing University of Posts and Telecommunications, Electronic Engineering Institute, Beijing 100876, P. R. China)

  • Mo Chen

    (Beijing University of Posts and Telecommunications, Institute of Network Technology, Beijing 100876, P. R. China)

Abstract

We study the structural robustness of the scale free network against the cascading failure induced by overload. In this paper, a failure mechanism based on betweenness-degree ratio distribution is proposed. In the cascading failure model we built the initial load of an edge which is proportional to the node betweenness of its ends. During the edge random deletion, we find a phase transition. Then based on the phase transition, we divide the process of the cascading failure into two parts: the robust area and the vulnerable area, and define the corresponding indicator to measure the performance of the networks in both areas. From derivation, we find that the vulnerability of the network is determined by the distribution of betweenness-degree ratio. After that we use the connection between the node ability coefficient and distribution of betweenness-degree ratio to explain the cascading failure mechanism. In simulations, we verify the correctness of our derivations. By changing connecting preferences, we find scale free networks with a slight assortativity, which performs better both in robust area and vulnerable area.

Suggested Citation

  • Xiao Juan Wang & Shi Ze Guo & Lei Jin & Mo Chen, 2017. "Cascading failures mechanism based on betweenness-degree ratio distribution with different connecting preferences," International Journal of Modern Physics C (IJMPC), World Scientific Publishing Co. Pte. Ltd., vol. 28(04), pages 1-18, April.
    • Handle: RePEc:wsi:ijmpcx:v:28:y:2017:i:04:n:s0129183117500528
    DOI: 10.1142/S0129183117500528
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