Author
Listed:
- Reza Kamali
(School of Mechanical Engineering, Shiraz University, Shiraz 71936-16548, Iran)
- Mohammad Karim Dehghan Manshadi
(School of Mechanical Engineering, Shiraz University, Shiraz 71936-16548, Iran)
Abstract
Microdroplet generation has a vast range of applications in the chemical, biomedical, and biological sciences. Several devices are applied to produce microdroplets, such as Co-flow, T-junction and Flow-focusing. The important point in the producing process is controlling the separated fluid volume in these devices. On the other hand, a large number of liquids, especially aqueous one, are influenced by electric or magnetic fields. As a consequence, an electric field could be used in order to affect the separated fluid volume. In this study, effects of an electric field on the microdroplet generation in a Co-flow device are investigated numerically. Furthermore, effects of some electrical properties such as permittivity on the separating process of microdroplets are studied. Leaky dielectric and perfect dielectric models are used in this investigation. According to the results, in the microdroplet generating process, leaky dielectric fluids show different behaviors, when an electric field is applied to the device. In other words, in a constant electric field strength, the volume of generated microdroplets can increase or decrease, in comparison with the condition without the electric field. However, for perfect dielectric fluids, droplet volume always decreases with increasing the electric field strength. In order to validate the numerical method of this study, deformation of a leaky dielectric droplet in an electric field is investigated. Results are compared with Taylor theoretical model.
Suggested Citation
Reza Kamali & Mohammad Karim Dehghan Manshadi, 2016.
"Numerical simulation of the leaky dielectric microdroplet generation in electric fields,"
International Journal of Modern Physics C (IJMPC), World Scientific Publishing Co. Pte. Ltd., vol. 27(01), pages 1-17, January.
Handle:
RePEc:wsi:ijmpcx:v:27:y:2016:i:01:n:s0129183116500121
DOI: 10.1142/S0129183116500121
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