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Pull-In Stability Of A Fractal Mems System And Its Pull-In Plateau

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  • JI-HUAN HE

    (School of Science, Xi’an University of Architecture and Technology, Xi’an, P. R. China†School of Mathematics and Information Science, Henan Polytechnic University, Jiaozuo, P. R. China‡National Engineering Laboratory for Modern Silk, College of Textile and Clothing Engineering, Soochow University, Suzhou, P. R. China)

  • QIAN YANG

    (School of Science, Xi’an University of Architecture and Technology, Xi’an, P. R. China)

  • CHUN-HUI HE

    (�School of Mathematics, China University of Mining and Technology, Xuzhou 221116, Jiangsu, P. R. China)

  • HAI-BIN LI

    (�School of Science, Inner Mongolia University of Technology, Hohhot 010051, P. R. China)

  • EERDUN BUHE

    (��School of Mathematics and Big Data, Hohhot University for Nationalities, Hohhot, P. R. China)

Abstract

The pull-in instability is the inherent property of a micro-electromechanical system (MEMS) when the voltage is larger than its threshold value. Recently, a fractal MEMS system was proposed to overcome the pull-in instability with great success, and it has opened a total new path for the so-called pull-in stability. This paper suggests a pull-in plateau, a novel concept for qualifying the pull-in stability. The plateau’s basic properties are elucidated, and the effect of the fractal dimensions on the plateau width is elucidated, and the paper concludes that there exists a critical condition for an ever pull-in stability when both the acceleration and the speed of the system equal zero.

Suggested Citation

  • Ji-Huan He & Qian Yang & Chun-Hui He & Hai-Bin Li & Eerdun Buhe, 2022. "Pull-In Stability Of A Fractal Mems System And Its Pull-In Plateau," FRACTALS (fractals), World Scientific Publishing Co. Pte. Ltd., vol. 30(09), pages 1-9, December.
    • Handle: RePEc:wsi:fracta:v:30:y:2022:i:09:n:s0218348x22501857
    DOI: 10.1142/S0218348X22501857
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