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Present practices and future plans for MIL‐STD‐781

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  • W. E. Wallace

Abstract

MIL‐STD‐781 specifies reliability acceptance test procedures based on both fixed‐length tests and probability ratio sequential tests. The assumption underlying MIL‐STD‐781 is a constant mean time between failures (MTBF) and typical practice applies MIL‐STD‐781 to electrical, electronic, and mechanical equipment. This article discusses some of the difficulties that have prompted the C and D revisions of MIL‐STD‐781. In addition, it discusses the relationship of MIL‐STD‐781 with MIL‐STD‐1635(EC) which deals with reliability growth testing. The article concludes with a discussion of needed research in reliability growth testing, in support of MIL‐STD‐781, and in the area of stress and its impact of MTBF.

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  • W. E. Wallace, 1985. "Present practices and future plans for MIL‐STD‐781," Naval Research Logistics Quarterly, John Wiley & Sons, vol. 32(1), pages 21-26, February.
    • Handle: RePEc:wly:navlog:v:32:y:1985:i:1:p:21-26
    DOI: 10.1002/nav.3800320106
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