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Exploratory data analysis for planar tessellations: Structural analysis and point process methods

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  • D. Stoyan
  • H. Stoyan

Abstract

This paper presents methods for the exploratory analysis of particular geometrical data, namely planar tessellations. At first, two non‐stochastic methods are suggested which may help to classify tessellations and to understand their structure. The first one consists of approximating a given tessellation by a Dirichlet tessellation. The other one uses the nodes of a given tessellation and tests the possibility of reconstructing it by a fixed rule of connecting nodes by edges. Furthermore, in order to obtain information on the spatial behaviour of a tessellation, we suggest the use of the methods of point process statistics. In particular, pair correlation and mark correlation functions describe spatial correlations in tessellations.

Suggested Citation

  • D. Stoyan & H. Stoyan, 1990. "Exploratory data analysis for planar tessellations: Structural analysis and point process methods," Applied Stochastic Models and Data Analysis, John Wiley & Sons, vol. 6(1), pages 13-25, March.
    • Handle: RePEc:wly:apsmda:v:6:y:1990:i:1:p:13-25
    DOI: 10.1002/asm.3150060103
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