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Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques

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  • Mišík Jozef
  • Pekarčíková Marcela
  • Janovec Jozef

    (Slovak University of Technology in Bratislava, Faculty of Materials Science and Technology in Trnava, Paulínska 16, 917 24 Trnava)

Abstract

(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.

Suggested Citation

  • Mišík Jozef & Pekarčíková Marcela & Janovec Jozef, 2014. "Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques," Research Papers Faculty of Materials Science and Technology Slovak University of Technology, Sciendo, vol. 21(341), pages 1-6, December.
  • Handle: RePEc:vrs:repfms:v:21:y:2014:i:341:p:6:n:20
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