Scheduling of multiple in-line steppers for semiconductor wafer fabs

A few prior studies noticed that an in-line stepper (a bottleneck machine in a semiconductor fab) may have a capacity loss while operated in a low-yield scenario. To alleviate such a capacity loss, some meta-heuristic algorithms for scheduling a single in-line stepper were proposed. Yet, in practice, there are multiple in-line steppers to be scheduled in a fab. This article aims to enhance prior algorithms so as to deal with the scheduling for multiple in-line steppers. Compared to prior studies, this research has to additionally consider how to appropriately allocate jobs to various machines. We enhance prior algorithms by developing a chromosome-decoding scheme which can yield a job-allocation decision for any given chromosome (or job sequence). Seven enhanced versions of meta-heuristic algorithms (genetic algorithm, Tabu, GA–Tabu, simulated annealing, M-MMAX, PACO and particle swarm optimisation) were then proposed and tested. Numerical experiments indicate that the GA–Tabu method outperforms the others. In addition, the lower the process yield, the better is the performance of the GA–Tabu algorithm.