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An integrated DEMATEL-MMDE-ISM based approach for analysing the barriers of IoT implementation in the manufacturing industry

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  • Rajdeep Singh
  • Neeraj Bhanot

Abstract

Incorporation of smart devices within the older framework has brought along significant challenges. This paper presents a detailed analysis of the barriers faced during the implementation of Internet of Things (IoT) within the manufacturing sector. In addition, the authors aim to obtain a hierarchical structure, which will help the policymakers to identify the most crucial barriers enabling them to make an informed decision. With the help of databases like Scopus, Web of Science, etc. a comprehensive list of 22 barriers was initially obtained. This list was further narrowed down to 10 critical barriers. The first step of the analysis involved the application of Decision Making Trial and Evaluation Laboratory (DEMATEL) technique, which quantifies the influence of the barriers amongst one another. Maximum Mean De-Entropy (MMDE) technique is then used to obtain a scientific threshold value, which is later used in the Interpretive Structural Modelling (ISM) technique from which a hierarchical structure of the barriers is obtained. The results of this study are expected to highlight the most crucial barriers wherein the researchers and practitioners can focus their strategic efforts. This will facilitate the addressal of implicit issues while implementing IoT Techniques in the manufacturing industry.

Suggested Citation

  • Rajdeep Singh & Neeraj Bhanot, 2020. "An integrated DEMATEL-MMDE-ISM based approach for analysing the barriers of IoT implementation in the manufacturing industry," International Journal of Production Research, Taylor & Francis Journals, vol. 58(8), pages 2454-2476, April.
    • Handle: RePEc:taf:tprsxx:v:58:y:2020:i:8:p:2454-2476
    DOI: 10.1080/00207543.2019.1675915
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