IDEAS home Printed from https://ideas.repec.org/a/taf/tprsxx/v54y2016i19p5686-5696.html
   My bibliography  Save this article

Improved method of estimating the product quality after multiple inspections

Author

Listed:
  • Young H. Chun

Abstract

A complex product is often inspected more than once in a sequential manner to ensure the product’s quality. Based on the number of defects discovered during each round of inspection process, we can estimate the number of defects still remaining in the product. For each defect, the probability that the defect will be detected during each inspection cycle is usually assumed to be a known ‘constant’. However, in many practical situations, some defects are easily detected, while others are much more difficult to identify. In this paper, we propose a ‘beta-geometric’ inspection model in which the heterogeneity in detection probability is described by a beta distribution. In a numerical study, we show that our more realistic inspection model clearly outperforms traditional estimation methods that are based on the assumption of a constant detection probability.

Suggested Citation

  • Young H. Chun, 2016. "Improved method of estimating the product quality after multiple inspections," International Journal of Production Research, Taylor & Francis Journals, vol. 54(19), pages 5686-5696, October.
    • Handle: RePEc:taf:tprsxx:v:54:y:2016:i:19:p:5686-5696
    DOI: 10.1080/00207543.2015.1128128
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.1080/00207543.2015.1128128
    Download Restriction: Access to full text is restricted to subscribers.
    File URL: https://libkey.io/10.1080/00207543.2015.1128128?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:tprsxx:v:54:y:2016:i:19:p:5686-5696. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/TPRS20 .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.