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A digital twin solution for fault detection in time-critical IIoT applications

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  • Amish Ranpariya
  • Sangeeta Sharma

Abstract

IIoT sensor data plays a pivotal role in monitoring the industrial system’s health and identifying potential faults. However, traditional fault detection approaches often face challenges such as network latency, limited accuracy, and resource-intensive processing. This paper introduces an end-to-end Digital Twin solution that enhances fault detection for IIoT systems. The solution is powered by two key innovations: the integration of a Digital Twin architecture that leverages a collaborative cloud-edge approach for real-time monitoring, and the use of a lightweight two-phased machine-learning ensemble model optimized for resource-constrained environments. The great performance achieved across various fault scenarios demonstrates the effectiveness of the proposed approach. The model provides an average accuracy of 99.71% with a mere 4.8 ms of average estimation delay. These advancements ensure both high accuracy and rapid response times, providing a robust solution for proactive fault detection in dynamic industrial environments.

Suggested Citation

  • Amish Ranpariya & Sangeeta Sharma, 2025. "A digital twin solution for fault detection in time-critical IIoT applications," Journal of Simulation, Taylor & Francis Journals, vol. 19(4), pages 441-454, July.
  • Handle: RePEc:taf:tjsmxx:v:19:y:2025:i:4:p:441-454
    DOI: 10.1080/17477778.2025.2453725
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