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Multi-band microwave sensor based on Hilbert’s fractal for dielectric solid material characterization

Author

Listed:
  • C. P. do N. Silva
  • J. A. I. Araujo
  • M. S. Coutinho
  • M. R. T. de Oliveira
  • I. Llamas-Garro
  • M. T. de Melo

Abstract

A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space-filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a multiband frequency response where miniaturization is achieved since a large transmission line length is effectively confined in a limited area. The sensor provides five resonances in the frequency range from 0 to 5 GHz. The resonant frequencies are 0.56, 1.68, 2.72, 3.69 and 4.72 GHz, all used to measure the real permittivity of known samples with a sensitivity of 7, 20, 27, 43 and 50 MHz/permittivity, respectively. The sensor is used to measure dielectric samples with 20 × 20 mm2 areas with several thicknesses. Simulations and measurements demonstrate that the Hilbert fractal geometry can be used to design a multiband planar sensor for solid dielectric material characterization.

Suggested Citation

  • C. P. do N. Silva & J. A. I. Araujo & M. S. Coutinho & M. R. T. de Oliveira & I. Llamas-Garro & M. T. de Melo, 2021. "Multi-band microwave sensor based on Hilbert’s fractal for dielectric solid material characterization," Journal of Electromagnetic Waves and Applications, Taylor & Francis Journals, vol. 35(7), pages 848-860, May.
    • Handle: RePEc:taf:tewaxx:v:35:y:2021:i:7:p:848-860
    DOI: 10.1080/09205071.2020.1861992
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