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Free space material characterization of carbon nanotube thin films at sub-terahertz frequencies

Author

Listed:
  • Sujitha Puthukodan
  • Ehsan Dadrasnia
  • Vinod V. K. Thalakkatukalathil
  • Horacio Lamela Rivera
  • Guillaume Ducournau
  • Jean-Francois Lampin

Abstract

A free space, non-destructive, vectorial continuous wave terahertz analysis method is employed to study the material properties of single-walled and multi-walled carbon nanotube thin films deposited on substrates of fused quartz and silicon. The electrical and optical properties of the thin films have been investigated using a vector network analyzer, in the frequency range of 220–325 GHz (WR 3.4) and 325–500 GHz (WR 2.2). The Nicolson–Ross–Weir method is used to extract the material parameters. The refractive index, absorption coefficient, and the complex conductivity of the single-walled and multi-walled carbon nanotube thin films are extracted and studied.

Suggested Citation

  • Sujitha Puthukodan & Ehsan Dadrasnia & Vinod V. K. Thalakkatukalathil & Horacio Lamela Rivera & Guillaume Ducournau & Jean-Francois Lampin, 2016. "Free space material characterization of carbon nanotube thin films at sub-terahertz frequencies," Journal of Electromagnetic Waves and Applications, Taylor & Francis Journals, vol. 30(5), pages 589-598, March.
    • Handle: RePEc:taf:tewaxx:v:30:y:2016:i:5:p:589-598
    DOI: 10.1080/09205071.2016.1138898
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